A New Automated System is Developed to Measure the Parameters of High-Speed ADCs and DACs

Graduates from the Yerevan Polytechnic University have developed an automated system for measuring the parameters of high-speed ADCs and DACs. The system performs functional control and measurement of static and dynamic parameters of high-speed ADCs and DACs (clock rate up to 800 MHz).

Software Appearance: Noise Measurement

The ADC and DAC microchips are some of the most common in modern electronic systems. ADC and DAC parameters measuring is a very important process in production, as their characteristics largely determine the quality of the end product.

Currently, a wide variety of such microcircuits are available on the market, which can differ by the data transfer method, by the logic of configuration or programming, thereby requiring flexibility and versatility of the control and verification system.

Taking in consideration the above, the Yerevan engineers developed a system that allows the operator to adapt the system to specific requirements.

The system is a certified product that can be used in development objectives and in production processes of semiconductor components.