Semiconductor
A New Automated System is Developed to Measure the Parameters of High-Speed ADCs and DACs
Graduates from the Yerevan Polytechnic University have developed an automated system for measuring the parameters of high-speed ADCs and DACs. The system performs functional control and measurement of static and dynamic parameters of high-speed ADCs and DACs (clock rate up to 800 MHz). The ADC and DAC microchips are some of the most common in modern […]
A New Universal Automated System is Developed to Test Radio Components
Graduates from the Yerevan Polytechnic University have developed a new universal system to test radio components of various types and purposes. With the help of this system, a large range of radio components, such as transistors, Zener diodes, thyristors, diodes, LEDs, relays, capacitors, resistors can be tested with maximum accuracy. The system allows to timely […]